Facilities

CHEM 3242 - Surface and Electrical Characterization Laboratory

afmlab1

probstation

afmlab

  • Multimode SFM (Digital Instruments) operated in nitrogen atmosphere glovebox with different scanning modes: STM, EFM, conducting AFM, tapping and contact AFM, liquid AFM, and MFM
  • Fluorimeter (Fluorolog)
  • Ambios XP-100 Profilometer
  • Vacuum Variable Temperature Probe Station (10 K - 475 K) with photoconductivity, AC and DC conductivity capability
  • Solartron Impedance/Gain Analyzer
  • Keithley 4200 Semiconductor Parameter Analyzer
  • Asylum SPM coupled with an Olympus inverted optical microscope, light sources, and filter wheels for photoconducting AFM measurements. Other operational modes are STM, EFM, scanning surface potential, conducting AFM, tapping and contact AFM, liquid AFM, and MFM
  • Innova SPM (Veeco) with different modes: STM, EFM, conducting AFM, tapping and contact AFM, liquid AFM, and MFM

CHEM 3142 - Device Fabrication/Solar Cell Characterization Laboratory

solarlab

  • Angstrom Engineering evaporator integrated into double-length glovebox
  • Spectra-physics 150 W 1.5 AM solar simulator with monochromator for EQE and J-V measurements
  • Electroabsorption setup
  • UV-Vis-IR spectrometer
  • Ultrasonic Vibra-Cell

CHEM 3138 - Device Fabrication/Light Emitting Diode Characterization Laboratory

devicelab

  • Thermal evaporator integrated into glovebox
  • Processing glovebox with spin-coater
  • OLED device characterization: J-V and EL measurements.
  • Laminar flow hood with spin-coater
  • UV-Ozone cleaner
  • Vacuum oven

CHEM 3146 - Wet Chemistry Laboratory

synthesis

CHEM 3239 - Room-Temperature Field-Effect Transistor Characterization Lab

fetlab

  • HP Semiconductor Analyzer (Agilent 4155C)
  • Room temperature probe station (Signatone 1160 Series)
  • Plasma cleaner (Harrick Plasma PDC-001)
  • Organic single crystal growth furnaces

CHEM 3247 - Device Fabrication/Polymer Film Processing Laboratory

CHEM 3109 - Kelvin Probe Setup

Campus Shared Facilities